Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/102890
Title: Variability-aware parametric yield estimation for analog/mixed-signal circuits : concepts, algorithms, and challenges
Authors: Shi, Yiyu
He, Lei
Yu, Hao
Gong, Fang
Keywords: DRNTU::Engineering::Electrical and electronic engineering
Issue Date: 2014
Source: Gong, F., Yu, H., Shi, Y., & He, L. (2014). Variability-aware parametric yield estimation for analog/mixed-signal circuits: Concepts, algorithms, and challenges. IEEE Design & Test, 31(4), 6-15.
Series/Report no.: IEEE design & test
Abstract: With technology scaling down to 90nm and below, process variation has become a primary challenge for both design and fabrication of analog/mixed-signal circuits due to significantly increased circuit failures and yield loss. As a result, it is urgently required to estimate the yield of one design efficiently in the presence of process variation. In this paper, we present the recent advance for yield estimation for analog/mixed-signal circuits with a number of critical topics and techniques discussed and classified into two categories. The first is performance domain method, which requires extensive Monte Carlo simulations; and the second is parameter domain method, which requires the characterization of yield boundary defined by performance constraints without using Monte Carlo. We review the pros and cons of these methods, which are evaluated by a number of circuit examples with quantitative comparison.
URI: https://hdl.handle.net/10356/102890
http://hdl.handle.net/10220/25713
ISSN: 2168-2356
DOI: 10.1109/MDAT.2014.2299279
Rights: © 2014 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The published version is available at: [http://dx.doi.org/10.1109/MDAT.2014.2299279].
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles

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