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Title: Fatigue behaviors of square-to-square hollow section T-joint with corner crack II : numerical modeling
Authors: Lee, Chi King
Chiew, Sing Ping
Lie, Seng Tjhen
Ji, Hong Li
Keywords: DRNTU::Engineering::Civil engineering::Structures and design
Issue Date: 2006
Source: Lee, C. K., Chiew, S. P., Lie, S. T.,& Ji, H. L. (2007). Fatigue behaviors of square-to-square hollow section T-joint with corner crack II : numerical modeling. Engineering fracture mechanics, 74(5), 721-738.
Series/Report no.: Engineering fracture mechanics
Abstract: Based on the experimental results obtained in the first part of the study, a geometrical model and a mesh generation procedure are suggested for the numerical modeling of the uncracked and cracked square-to-square hollow section (SSHS) T-joints. In the proposed model, the surface crack is represented as an unsymmetrical 3D curved surface with the deepest point located at the corner of the brace-chord intersection. The mesh generation scheme developed is capable to generate well graded finite element (FE) meshes for cracked SSHS T-joints with multiple cracks. The validity of the proposed geometrical model and the reliability of the proposed mesh generation scheme are checked by comparing the predicted SIFs and the residual life against those computed based on the actual measurements. It is found that the suggested modeling method is reliable in the sense that conservative predictions for the SIFs and the residual life are obtained from the numerical simulations.
ISSN: 0013-7944
DOI: 10.1016/j.engfracmech.2006.06.021
Rights: © 2006 Elsevier. This is the author created version of a work that has been peer reviewed and accepted for publication by Engineering Fracture Mechanics, Elsevier. It incorporates referee’s comments but changes resulting from the publishing process, such as copyediting, structural formatting, may not be reflected in this document. The published version is available at: [Article DOI:].
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:CEE Journal Articles

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