Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/103120
Title: Variability-aware parametric yield estimation for analog/mixed-signal circuits : concepts, algorithms and challenges
Authors: Gong, Fang
Shi, Yiyu
Yu, Hao
He, Lei
Keywords: DRNTU::Engineering::Electrical and electronic engineering
Issue Date: 2013
Source: Gong, F., Shi, Y., Yu, H., & He, L. (2014). Variability-aware parametric yield estimation for analog/mixed-signal circuits : concepts, algorithms and challenges. IEEE Design & Test, 1-1.
Series/Report no.: IEEE design & test
Abstract: With technology scaling down to 90nm and below, process variation has become a primary challenge for both design and fabrication of analog/mixed-signal circuits due to significantly increased circuit failures and yield loss. As a result, it is urgently required to estimate the yield of one design efficiently in the presence of process variation. In this paper, we present the recent advance for yield estimation for analog/mixed-signal circuits with a number of critical topics and techniques discussed and classified into two categories. The first is performance domain method, which requires extensive Monte Carlo simulations; and the second is parameter domain method, which requires the characterization of yield boundary defined by performance constraints without using Monte Carlo. We review the pros and cons of these methods, which are evaluated by a number of circuit examples with quantitative comparison.
URI: https://hdl.handle.net/10356/103120
http://hdl.handle.net/10220/19252
ISSN: 2168-2356
DOI: 10.1109/MDAT.2014.2299279
Rights: © 2013 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The published version is available at: [http://dx.doi.org/10.1109/MDAT.2014.2299279].
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles

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