Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/103128
Title: Robust representation and recognition of facial emotions using extreme sparse learning
Authors: Li, Jun
Teoh, Eam Khwang
Nandakumar, Karthik
Shojaeilangari, Seyedehsamaneh
Yau, Wei-Yun
Keywords: DRNTU::Engineering::Computer science and engineering::Computing methodologies::Image processing and computer vision
Issue Date: 2015
Source: Shojaeilangari, S., Yau, W.-Y., Nandakumar, K., Li, J., & Teoh, E. K. (2015). Robust representation and recognition of facial emotions using extreme sparse learning. IEEE transactions on image processing, 24(7), 2140-2152.
Series/Report no.: IEEE transactions on image processing
Abstract: Recognition of natural emotions from human faces is an interesting topic with a wide range of potential applications, such as human-computer interaction, automated tutoring systems, image and video retrieval, smart environments, and driver warning systems. Traditionally, facial emotion recognition systems have been evaluated on laboratory controlled data, which is not representative of the environment faced in real-world applications. To robustly recognize the facial emotions in real-world natural situations, this paper proposes an approach called extreme sparse learning, which has the ability to jointly learn a dictionary (set of basis) and a nonlinear classification model. The proposed approach combines the discriminative power of extreme learning machine with the reconstruction property of sparse representation to enable accurate classification when presented with noisy signals and imperfect data recorded in natural settings. In addition, this paper presents a new local spatio-temporal descriptor that is distinctive and pose-invariant. The proposed framework is able to achieve the state-of-the-art recognition accuracy on both acted and spontaneous facial emotion databases.
URI: https://hdl.handle.net/10356/103128
http://hdl.handle.net/10220/25737
DOI: 10.1109/TIP.2015.2416634
Schools: School of Electrical and Electronic Engineering 
Rights: © 2015 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The published version is available at: [http://dx.doi.org/10.1109/TIP.2015.2416634].
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles

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