Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/103146
Title: Modeling of nucleation and growth during vapor condensation on liquid substrates
Authors: Anantha, P.
Cheng, Ting
Wong, Chee Cheong
Keywords: DRNTU::Engineering::Materials::Material testing and characterization
Issue Date: 2013
Source: Anantha, P., Cheng, T., & Wong, C. C. (2014). Modeling of nucleation and growth during vapor condensation on liquid substrates. Journal of materials science, 49(3), 1025-1033.
Series/Report no.: Journal of materials science
Abstract: The study investigates the effect of inherent structural properties of liquid substrates on physical vapor-deposited metallic condensates. Due to the limitations in characterizing the atomic structure of different kinds of liquids, quantitative analysis of all the influencing parameters of the liquid substrate is difficult. Real time considered computing simulation is called for to realize the effects of such properties, which gives direct analyzable results. As representatives of physical and chemical properties of substrates, the molecular frequency and adsorption probability (~binding energy) are utilized as the key simulation parameters. Nucleation kinetics represented by conventional equations and an adapted time algorithm are employed to guarantee a correct, comparable and efficient simulation technique. The results show the substrates’ influence on the ‘morphology’ and ‘formation time’ of the film. In particular, the non-uniform morphology and low coverage observed under ‘liquid-substrate conditions’ are in agreement with experimental observations. The method can also be applied for predicting the condensate morphology for various vapor/substrate systems with known conditions.
URI: https://hdl.handle.net/10356/103146
http://hdl.handle.net/10220/24462
ISSN: 0022-2461
DOI: 10.1007/s10853-013-7779-6
Rights: © 2013 Springer Science+Business Media New York.
Fulltext Permission: none
Fulltext Availability: No Fulltext
Appears in Collections:MSE Journal Articles

Google ScholarTM

Check

Altmetric

Items in DR-NTU are protected by copyright, with all rights reserved, unless otherwise indicated.