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Title: Defects improved photocatalytic ability of TiO2
Authors: Li, Lei
Tian, Hong-Wei
Meng, Fan-Ling
Hu, Xiao-Ying
Zheng, Wei-Tao
Sun, Chang Qing
Keywords: DRNTU::Science::Chemistry::Physical chemistry::Surface chemistry
Issue Date: 2014
Source: Li, L., Tian, H.-W., Meng, F.-L., Hu, X.-Y., Zheng, W.-T., & Sun, C. Q. (2014). Defects improved photocatalytic ability of TiO2. Applied surface science, 317, 568-572.
Series/Report no.: Applied surface science
Abstract: Defect generation forms an important means modulating the photocatalytic ability of TiO2 with mechanisms that remain yet unclear. Here we show that a spectral distillation clarifies the impact of defect on modulating the band gap, electroaffinity, and work function of the substance. Firstly, by analyzing XPS measurements, we calibrated the 2p3/2 level of 451.47 eV for an isolated Ti atom and its shifts by 2.14 and 6.94 eV, respectively, upon Ti and TiO2 bulk formation. Spectral difference between the defected and the un-defected TiO2 skin revealed then that the 2p3/2 level shifts further from 6.94 to 9.67 eV due to the defect-induced quantum entrapment. This entrapment is associated with an elevation of the upper edges of both the 2p3/2 and the conduction band by polarization. The shortening and strengthening of bonds between undercoordinated atoms densify and entrap the core electrons, which in turn polarize the dangling bond electrons of defect atoms. The entrapment and polarization mediate thus the band gap, the electroaffinity, the work function, and the photocatalytic ability of TiO2.
ISSN: 0169-4332
DOI: 10.1016/j.apsusc.2014.08.078
Rights: © 2014 Elsevier B.V. This is the author created version of a work that has been peer reviewed and accepted for publication by Applied Surface Science, Elsevier B.V. It incorporates referee’s comments but changes resulting from the publishing process, such as copyediting, structural formatting, may not be reflected in this document. The published version is available at: [Article DOI:].
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles

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