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https://hdl.handle.net/10356/103776
Title: | Fiber-optic temperature sensor based on temperature-dependent refractive index of Germanium-silica coating stack | Authors: | Huang, Yuanshen Zhang, Daohua Zhang, Dawei Tao, Chunxian Hong, Ruijin |
Keywords: | DRNTU::Engineering::Electrical and electronic engineering::Optics, optoelectronics, photonics | Issue Date: | 2014 | Source: | Tao, C., Zhang, D., Hong, R., Huang, Y., & Zhang, D. (2014). Fiber-optic temperature sensor based on temperature-dependent refractive index of Germanium-silica coating stack. Sensors and materials, 26(10), 745-751. | Series/Report no.: | Sensors and materials | Abstract: | We report on a novel fiber-optic temperature sensor based on the temperature-dependent refractive index of a germanium-silica (Ge-SiO2) coating stack. The relationship between the reflectivity and the temperature-dependent refractive index of the Ge-SiO2 coating stack at 1550 nm is theoretically investigated. A reflection-type fiber-optic probe with high sensitivity and wide response range is designed and fabricated by physical vapor deposition. Experimental results show that the reflectivity is linearly dependent on temperature in the range of -30 to 130 oC, and the sensor exhibits high sensitivity and structural stability in the range of 50 to 500 K. | URI: | https://hdl.handle.net/10356/103776 http://hdl.handle.net/10220/25841 |
Rights: | © 2014 MYU K.K. This paper was published in Sensors and Materials and is made available as an electronic reprint (preprint) with permission of MYU K.K. The paper can be found at the following official URL: [http://www.myu-inc.jp/myukk/S&M/paper3.html]. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law. | Fulltext Permission: | open | Fulltext Availability: | With Fulltext |
Appears in Collections: | EEE Journal Articles |
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