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|Title:||Operational adequacy studies of a PV-based & energy storage stand-alone microgrid||Authors:||Gao, Zhiyong
Püttgen, Hans B.
Koh, Leong Hai
Choo, Fook Hoong
|Keywords:||DRNTU::Engineering::Electrical and electronic engineering::Power electronics||Issue Date:||2015||Source:||Koh, L. H., Wang, P., Choo, F. H., Tseng, K.-J., Gao, Z., & Püttgen, H. B. (2015). Operational adequacy studies of a PV-based & energy storage stand-alone microgrid. IEEE Transactions on power systems, 30(2), 892-900.||Series/Report no.:||IEEE transactions on power systems||Abstract:||This paper presents a probabilistic approach in the modeling of stand-alone microgrids to predict their operational adequacy performance considering uncertainty of energy storage system (ESS), photovoltaic system (PVS) and conventional generator (CG). Instead of using the daily or hourly time step, operating period a minutely time step is considered to incorporate the effect of fast ramp up/down of system components on microgrid operating adequacy through expected energy not supplied (EENS) and expected energy not used (EENU), due to load and resource variations. A time varying state of charge (SOC) model is proposed to determine power output of an ESS in reliability modeling. The reliability of a PVS is modeled in detail based on the total cross-tied configuration (TCTC) of photovoltaic (PV) cells and arrays. The proposed technique and indices will be useful for system planners to select the type and size of microgrid systems that contain alternative energy sources and storage.||URI:||https://hdl.handle.net/10356/104638
|DOI:||10.1109/TPWRS.2014.2334603||Rights:||© 2015 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The published version is available at: [http://dx.doi.org/10.1109/TPWRS.2014.2334603].||Fulltext Permission:||open||Fulltext Availability:||With Fulltext|
|Appears in Collections:||EEE Journal Articles|
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