Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/104844
Title: Optical metrology under extreme conditions
Authors: Li, Xide
Pedrini, Giancarlo
Fu, Yu
Keywords: DRNTU::Science::Physics::Weights and measures
Issue Date: 2014
Source: Li, X., Pedrini, G., & Fu, Y. (2014). Optical Metrology under Extreme Conditions. The Scientific World Journal, 2014, 263603-.
Series/Report no.: The scientific world journal
Abstract: Abstract is not available in fulltext.
URI: https://hdl.handle.net/10356/104844
http://hdl.handle.net/10220/20371
ISSN: 1537-744X
DOI: 10.1155/2014/263603
Rights: © 2014 Xide Li et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:TL Journal Articles

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