Please use this identifier to cite or link to this item:
https://hdl.handle.net/10356/104844| Title: | Optical metrology under extreme conditions | Authors: | Li, Xide Pedrini, Giancarlo Fu, Yu |
Keywords: | DRNTU::Science::Physics::Weights and measures | Issue Date: | 2014 | Source: | Li, X., Pedrini, G., & Fu, Y. (2014). Optical Metrology under Extreme Conditions. The Scientific World Journal, 2014, 263603-. | Series/Report no.: | The scientific world journal | Abstract: | Abstract is not available in fulltext. | URI: | https://hdl.handle.net/10356/104844 http://hdl.handle.net/10220/20371 |
ISSN: | 1537-744X | DOI: | 10.1155/2014/263603 | Rights: | © 2014 Xide Li et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. | Fulltext Permission: | open | Fulltext Availability: | With Fulltext |
| Appears in Collections: | TL Journal Articles |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Optical metrology under extreme conditions.pdf | 1.2 MB | Adobe PDF |  View/Open |
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