Please use this identifier to cite or link to this item:
Title: Optical metrology under extreme conditions
Authors: Li, Xide
Pedrini, Giancarlo
Fu, Yu
Keywords: DRNTU::Science::Physics::Weights and measures
Issue Date: 2014
Source: Li, X., Pedrini, G., & Fu, Y. (2014). Optical Metrology under Extreme Conditions. The Scientific World Journal, 2014, 263603-.
Series/Report no.: The scientific world journal
Abstract: Abstract is not available in fulltext.
ISSN: 1537-744X
DOI: 10.1155/2014/263603
Rights: © 2014 Xide Li et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:TL Journal Articles

Files in This Item:
File Description SizeFormat 
Optical metrology under extreme conditions.pdf1.2 MBAdobe PDFThumbnail

Page view(s) 50

Updated on Feb 6, 2023

Download(s) 20

Updated on Feb 6, 2023

Google ScholarTM




Items in DR-NTU are protected by copyright, with all rights reserved, unless otherwise indicated.