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|Title:||Highly sensitive refractive index sensor based on two cascaded microfiber knots with vernier effect||Authors:||Sun, Qizhen
Shum, Perry Ping
|Keywords:||DRNTU::Engineering::Electrical and electronic engineering||Issue Date:||2014||Source:||Xu, Z., Sun, Q., Jia, W., Shum, P. P., & Liu, D. (2014). Highly sensitive refractive index sensor based on two cascaded microfiber knots with Vernier effect. Proceedings SPIE 9157, 23rd International Conference on Optical Fibre Sensors.||Abstract:||A highly sensitive refractive index (RI) sensor based on two cascaded microfiber knots with vernier effect is proposed and demonstrated by theoretical arithmetic. Deriving from high proportional evanescent field of microfiber and sharp spectrum fringes induced by vernier effect, a slight change of ambient RI will cause large variation of effective RI and significant wavelength shift of resonant peaks, indicating high sensitivity and resolution of the proposed compound resonator. Numerical analysis demonstrates a high sensitivity of 10000nm/RIU and a resolution of 5.57×10−5 RIU at the ambient RI around 1.33 for the fiber diameter of 1μm and cavity radii of R1 = 500μm, R2 = 547.62μm.||URI:||https://hdl.handle.net/10356/104853
|Rights:||© 2014 Society of Photo-Optical Instrumentation Engineers (SPIE). This paper was published in Proceedings SPIE 9157, 23rd International Conference on Optical Fibre Sensors and is made available as an electronic reprint (preprint) with permission of Society of Photo-Optical Instrumentation Engineers (SPIE). The paper can be found at the following official URL: [http://proceedings.spiedigitallibrary.org/proceeding.aspx?articleid=1877956]. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.||Fulltext Permission:||open||Fulltext Availability:||With Fulltext|
|Appears in Collections:||EEE Conference Papers|
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