Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/104944
Title: Highly reliable memory-based physical unclonable function using spin-transfer torque MRAM
Authors: Kong, Zhi Hui
Roy, Kaushik
Zhang, Le
Chang, Chip-Hong
Fong, Xuanyao
Keywords: DRNTU::Engineering::Electrical and electronic engineering::Electronic systems
Issue Date: 2014
Source: Zhang, L., Fong, X., Chang, C.-H., Kong, Z . H., & Roy, K. (2014). Highly reliable memory-based physical unclonable function using spin-transfer torque MRAM. 2014 IEEE International Symposium on Circuits and Systems (ISCAS), 2169-2172.
Conference: 2014 IEEE International Symposium on Circuits and Systems (ISCAS)
Abstract: In recent years, Physical Unclonable Function (PUF) based on the inimitable and unpredictable disorder of physical devices has emerged to address security issues related to cryptographic key generation. In this paper, a novel memory-based PUF based on Spin-Transfer Torque (STT) Magnetic RAM, named as STT-PUF, is proposed as a key generation primitive for embedded computing systems. By comparing the resistances of STT-MRAM memory cells which are initialized to the same state, response bits can be generated by exploiting the inherent random mismatches between them. To enhance the robustness of response bits regeneration, an Automatic Write-Back (AWB) technique is proposed without compromising the resilience of STT-PUF against possible attacks. Simulations show that the proposed STT-PUF is able to produce raw response bits with uniqueness of 50.1% and entropy of 0.985 bit per cell. The worst-case Bit-Error Rate (BER) under varying operating conditions is 6.6 × 10-6.
URI: https://hdl.handle.net/10356/104944
http://hdl.handle.net/10220/25885
DOI: 10.1109/ISCAS.2014.6865598
Schools: School of Electrical and Electronic Engineering 
Rights: © 2015 Institute of Electrical and Electronics Engineers (IEEE).
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Conference Papers

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