Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/105041
Title: New algorithm for signed integer comparison in four-moduli superset {2n, 2n −1, 2n +1, 2n+1−1}
Authors: Tay, Thian Fatt
Chang, Chip-Hong
Keywords: DRNTU::Engineering::Electrical and electronic engineering::Electronic circuits
Issue Date: 2014
Source: Tay, T. F., & Chang, C.-H. (2014). New algorithm for signed integer comparison in four-moduli superset {2n, 2n −1, 2n +1, 2n+1−1}. 2014 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS), 519-522.
Conference: 2014 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)
Abstract: Sign detection and magnitude comparison are two difficult operations in Residue Number System (RNS). Existing residue comparators tackle only unsigned integer for magnitude comparison. In this paper, a new algorithm for signed integer comparison in the four-moduli supersets, {2n, 2n -1, 2n +1, 2n+1-1} with even n, is proposed. The dynamic range is quantized into equal subranges to facilitate fast sign detection and magnitude comparison simultaneously without the need for full magnitude recovery by Chinese Remainder Theorem (CRT) or sequential Mixed Radix Conversion (MRC). The proposed algorithm can be implemented by using adders only and the operations are less complex than those used in existing RNS magnitude comparators of comparable dynamic range.
URI: https://hdl.handle.net/10356/105041
http://hdl.handle.net/10220/25166
DOI: 10.1109/APCCAS.2014.7032833
Schools: School of Electrical and Electronic Engineering 
Rights: © 2014 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The published version is available at: [http://dx.doi.org/10.1109/APCCAS.2014.7032833].
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Conference Papers

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