Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/105042
Title: Leakage-resilient memory-based physical unclonable function using phase change material
Authors: Zhang, Le
Chang, Chip-Hong
Cabrini, Alessandro
Torelli, Guido
Kong, Zhi Hui
Keywords: DRNTU::Engineering::Electrical and electronic engineering
Issue Date: 2014
Source: Zhang, L., Chang, C.-H., Cabrini, A., Torelli, G., & Kong, Z. H. (2014). Leakage-resilient memory-based physical unclonable function using phase change material. 2014 International Carnahan Conference on Security Technology (ICCST), 1-6.
Abstract: Memory-based Physical Unclonable Function (MemPUF) emerged as a replacement for traditional key preservation primitives to overcome the susceptibility of secret keys to physical attacks. Recent experiments demonstrated that even some MemPUFs can be physically attacked by exploiting their side-channel information. In this paper, we formulate an adversary model for a prediction attack that takes advantage of the side-channel information leaked from a MemPUF. Based on this pivotal insight, we propose countermeasures to enhance the resilience of MemPUFs against such a kind of attack, and introduce a security-enhanced MemPUF design using phase change material. Our analysis demonstrated the effectiveness of our proposed scheme against the measurement-prediction attack given an adversary with certain bounded attack capability.
URI: https://hdl.handle.net/10356/105042
http://hdl.handle.net/10220/25165
DOI: 10.1109/CCST.2014.6987047
Rights: © 2014 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The published version is available at: [http://dx.doi.org/10.1109/CCST.2014.6987047].
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Conference Papers

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