Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/105071
Full metadata record
DC FieldValueLanguage
dc.contributor.authorZuo, Chaoen
dc.contributor.authorChen, Qianen
dc.contributor.authorLi, Hongruen
dc.contributor.authorQu, Weijuanen
dc.contributor.authorAsundi, Ananden
dc.date.accessioned2014-08-25T05:22:39Zen
dc.date.accessioned2019-12-06T21:45:37Z-
dc.date.available2014-08-25T05:22:39Zen
dc.date.available2019-12-06T21:45:37Z-
dc.date.copyright2014en
dc.date.issued2014en
dc.identifier.citationZuo, C., Chen, Q., Li, H., Qu, W., & Asundi, A. (2014). Boundary-artifact-free phase retrieval with the transport of intensity equation II: applications to microlens characterization. Optics Express, 22(15), 18310-18324.en
dc.identifier.issn1094-4087en
dc.identifier.urihttps://hdl.handle.net/10356/105071-
dc.description.abstractBoundary conditions play a crucial role in the solution of the transport of intensity equation (TIE). If not appropriately handled, they can create significant boundary artifacts across the reconstruction result. In a previous paper [Opt. Express 22, 9220 (2014)], we presented a new boundary-artifact-free TIE phase retrieval method with use of discrete cosine transform (DCT). Here we report its experimental investigations with applications to the micro-optics characterization. The experimental setup is based on a tunable lens based 4f system attached to a non-modified inverted bright-field microscope. We establish inhomogeneous Neumann boundary values by placing a rectangular aperture in the intermediate image plane of the microscope. Then the boundary values are applied to solve the TIE with our DCT-based TIE solver. Experimental results on microlenses highlight the importance of boundary conditions that often overlooked in simplified models, and confirm that our approach effectively avoid the boundary error even when objects are located at the image borders. It is further demonstrated that our technique is non-interferometric, accurate, fast, full-field, and flexible, rendering it a promising metrological tool for the micro-optics inspection.en
dc.language.isoenen
dc.relation.ispartofseriesOptics expressen
dc.rights© 2014 Optical Society of America. This paper was published in Optics Express and is made available as an electronic reprint (preprint) with permission of Optical Society of America. The paper can be found at the following official DOI: http://dx.doi.org/10.1364/OE.22.018310.  One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.en
dc.subjectDRNTU::Engineering::Electrical and electronic engineering::Optics, optoelectronics, photonicsen
dc.titleBoundary-artifact-free phase retrieval with the transport of intensity equation II: applications to microlens characterizationen
dc.typeJournal Articleen
dc.contributor.schoolSchool of Mechanical and Aerospace Engineeringen
dc.identifier.doi10.1364/OE.22.018310en
dc.description.versionPublished versionen
item.fulltextWith Fulltext-
item.grantfulltextopen-
Appears in Collections:MAE Journal Articles
Files in This Item:
File Description SizeFormat 
oe-22-15-18310.pdf4.49 MBAdobe PDFThumbnail
View/Open

SCOPUSTM   
Citations 10

45
Updated on Mar 22, 2024

Web of ScienceTM
Citations 10

39
Updated on Oct 26, 2023

Page view(s) 50

544
Updated on Mar 28, 2024

Download(s) 5

499
Updated on Mar 28, 2024

Google ScholarTM

Check

Altmetric


Plumx

Items in DR-NTU are protected by copyright, with all rights reserved, unless otherwise indicated.