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Title: An empirical approach to develop near-field limit for radiated-emission compliance check
Authors: See, Kye Yak
Fang, Ning
Wang, Lin-Biao
Soh, Weishan
Svimonishvili, Tengiz
Oswal, Manish
Chang, Weng-Yew
Koh, Wee-Jin
Keywords: DRNTU::Engineering::Electrical and electronic engineering
Issue Date: 2014
Source: See, K. Y., Fang, N., Wang, L. B., Soh, W., Svimonishvili, T., Oswal, M., et al. (2014). An empirical Approach to develop near-field limit for radiated-emission compliance check. IEEE transactions on electromagnetic compatibility, 56(3), 691-698.
Series/Report no.: IEEE transactions on electromagnetic compatibility
Abstract: Based on measurements from a near-field scanner and far-field measurements obtained in a semi-anechoic chamber, a statistical relationship is established between a magnetic field in the near field and an electric field in the far field. The relationship makes it possible to transform a radiated-emission regulatory limit from the far-field to the near-field zone. The transformed near-field limit can allow efficient prediction of radiated-emission compliance for high-speed printed circuit boards. The presented results demonstrate the feasibility of the proposed method for a quick radiated-emission precompliance check without heavy equipment investment.
DOI: 10.1109/TEMC.2014.2302003
Rights: © 2014 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The published version is available at: [].
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles

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