Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/105263
Title: Nano-imaging collagen by atomic force, near-field and nonlinear microscope
Authors: Lim, Ken Choong
Tang, Jinkai
Li, Hao
Ng, Boon Ping
Kok, Shaw Wei
Wang, Qijie
Zhang, Ying
Keywords: DRNTU::Engineering::Electrical and electronic engineering::Optics, optoelectronics, photonics
Issue Date: 2015
Source: Lim, K. C., Tang, J., Li, H., Ng, B. P., Kok, S. W., Wang, Q., et al. (2015). Nano-imaging collagen by atomic force, near-field and nonlinear microscope. Progress in biomedical optics and imaging - Proceedings of SPIE, 9337, 933709-.
Abstract: As the most abundant protein in the human body, collagen has a very important role in vast numbers of bio-medical applications. The unique second order nonlinear properties of fibrillar collagen make it a very important index in nonlinear optical imaging based disease diagnosis of the brain, skin, liver, colon, kidney, bone, heart and other organs in the human body. The second-order nonlinear susceptibility of collagen has been explored at the macroscopic level and was explained as a volume-averaged molecular hyperpolarizability. However, details about the origin of optical second harmonic signals from collagen fibrils at the molecular level are still not clear. Such information is necessary for accurate interpolation of bio-information from nonlinear optical imaging techniques. The later has shown great potential in collagen based disease diagnosis methodologies. In this paper, we report our work using an atomic force microscope (AFM), near field (SNOM) and nonlinear laser scanning microscope (NLSM) to study the structure of collagen fibrils and other pro-collagen structures.
URI: https://hdl.handle.net/10356/105263
http://hdl.handle.net/10220/26037
DOI: 10.1117/12.2078911
Rights: © 2015 Society of Photo-Optical Instrumentation Engineers (SPIE). This paper was published in Progress in Biomedical Optics and Imaging - Proceedings of SPIE and is made available as an electronic reprint (preprint) with permission of Society of Photo-Optical Instrumentation Engineers (SPIE). The paper can be found at the following official DOI: [http://dx.doi.org/10.1117/12.2078911]. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Conference Papers

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