Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/105343
Title: Relative intensity noise of silicon hybrid laser
Authors: Hu, Xiao Nan
Liu, Tao
Cao, Yu-Lian
Meng, Bo
Wang, Hong
Ng, Geok Ing
Luo, Xian Shu
Liow, Tsung Yang
Song, Jun Feng
Lo, Guo Qiang
Wang, Qi Jie
Keywords: DRNTU::Engineering::Electrical and electronic engineering::Antennas, wave guides, microwaves, radar, radio
Issue Date: 2014
Source: Hu, X. N., Liu, T., Cao, Y.-L., Meng, B., Wang, H., Ng, G. I., et al. (2014). Relative Intensity Noise of Silicon Hybrid Laser. IEEE Journal of Quantum Electronics, 50(6), 466-473.
Series/Report no.: IEEE journal of quantum electronics
Abstract: We theoretically investigate the relative intensity noise (RIN) of a silicon hybrid laser by taking into account two-dimension transverse modes in the hybrid waveguide. It shows that, when only one transverse mode is excited, RIN spectrum of the hybrid laser exhibits a larger peak value at a lower relaxation oscillation (RO) frequency as compared with the case of a conventional multiple-quantum well (MQW) laser with the the same active region design and dimension. In contrast, when two transverse modes are excited, the hybrid laser shows a lower peak value at a higher RO frequency as compared with the MQW laser. The effects of waveguide dimensions, e.g., Si ridge height and IIII-V ridge width on RIN spectra of the hybrid laser are also investigated.
URI: https://hdl.handle.net/10356/105343
http://hdl.handle.net/10220/20505
ISSN: 0018-9197
DOI: 10.1109/JQE.2014.2315212
Rights: © 2014 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The published version is available at: [DOI:http://dx.doi.org/10.1109/JQE.2014.2315212].
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles
SPMS Journal Articles

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