Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/105521
Title: Under-coordinated atoms induced local strain, quantum trap depression and valence charge polarization at W stepped surfaces
Authors: Wang, Yan
Zhang, Xi
Nie, Yanguang
Sun, Changqing
Keywords: DRNTU::Engineering::Electrical and electronic engineering
Issue Date: 2011
Source: Wang, Y., Zhang, X., Nie, Y., & Sun, C. (2011). Under-coordinated atoms induced local strain, quantum trap depression and valence charge polarization at W stepped surfaces. Physica B : condensed matter, 407(1), 49-53.
Series/Report no.: Physica B : condensed matter
Abstract: We have explored the effects of atoms under-coordination on surface structure relaxation, binding energy shift of W stepped surfaces and valence charge polarization by the method of incorporating bond order-length-strength (BOLS) correlation mechanism into high-resolution X-ray photoluminescence spectra (XPS) measurements as well as density functional theory (DFT) calculations. Results show that the 4f7/2 energy levels of bulk, surface skin and step edge W atoms shift deeper from 2.17 to 2.69 eV with respect to that of the isolated W (28.91±0.01 eV) atoms, while the valence charge energy shift upper from inner to outer layer and from bulk to stepped edge. The surface bond contraction occurs around under-coordinated atoms after geometry relaxation calculation. Consistency among BOLS calculations, DFT calculation and experimental measurements clarifies that the surface bond contraction and consolidation due to the effects of under-coordination atoms induce potential trap depression, which provides perturbation to the Hamiltonian and hence contributes to the surface core level shift deeper, and that the surface valence charge are polarized by the densely trapped core-level electrons to upper energy.
URI: https://hdl.handle.net/10356/105521
http://hdl.handle.net/10220/17734
ISSN: 0921-4526
DOI: 10.1016/j.physb.2011.09.117
Schools: School of Electrical and Electronic Engineering 
Fulltext Permission: none
Fulltext Availability: No Fulltext
Appears in Collections:EEE Journal Articles

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