Please use this identifier to cite or link to this item:
https://hdl.handle.net/10356/105578
Title: | A 0.18-μm CMOS voltage-to-frequency converter with low circuit sensitivity | Authors: | Koay, Kuan Chuang Chan, Pak Kwong |
Keywords: | Switched-capacitor Circuit Engineering::Electrical and electronic engineering Transconductor |
Issue Date: | 2018 | Source: | Koay, K. C., & Chan, P. K. (2018). A 0.18-μm CMOS voltage-to-frequency converter with low circuit sensitivity. IEEE Sensors Journal, 18(15), 6245-6253. doi:10.1109/JSEN.2018.2846635 | Series/Report no.: | IEEE Sensors Journal | Abstract: | A process, voltage, and temperature insensitive resistor-to-frequency converter is proposed. This insensitivity is achieved by matching the current-defining capacitor in a novel switched-capacitor (SC) voltage-to-current (V-I) converter with the integrating capacitor in a conventional relaxation oscillator. Implemented in 0.18-μm CMOS technology, the SC V-I converter together with the relaxation oscillator and voltage regulator occupies 0.45 mm 2 . This paper has shown a sensitivity of 199.9 Hz/(μQ/Q), which is based on a center frequency of 125 kHz. Testing with a commercial sensor, the sensor interface has demonstrated a sensitivity of 1.269 kHz/psi. The sensor interface consumes only 112.5 μW at 1.5-V power supply. Therefore, it is suitable for Internet-of-Things applications. | URI: | https://hdl.handle.net/10356/105578 http://hdl.handle.net/10220/50161 |
ISSN: | 1530-437X | DOI: | 10.1109/JSEN.2018.2846635 | Rights: | © 2018 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The published version is available at: https://doi.org/10.1109/JSEN.2018.2846635 | Fulltext Permission: | open | Fulltext Availability: | With Fulltext |
Appears in Collections: | EEE Journal Articles |
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