Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/105596
Title: A complete and fully automated face verification system on mobile devices
Authors: Ren, Jianfeng
Jiang, Xudong
Yuan, Junsong
Keywords: DRNTU::Engineering::Electrical and electronic engineering
Issue Date: 2012
Source: Ren, J., Jiang, X., & Yuan, J. (2013). A complete and fully automated face verification system on mobile devices. Pattern Recognition, 46(1), 45-56.
Series/Report no.: Pattern recognition
Abstract: Mobile devices have been widely used not only as a communication tool, but also a digital assistance to our daily life, which imposes high security concern on mobile devices. In this paper we present a natural and non-intrusive way to secure mobile devices, i.e. a complete and fully automated face verification system. It consists of three sub-systems: face detection, alignment and verification. The proposed subspace face/eye detector locates the eyes at a much higher precision than Adaboost face/eye detector. By utilizing attentional cascade strategy, the proposed face/eye detector achieves a comparable speed to Adaboost face/eye detector in this “close-range” application. The proposed approach that determines the class-specific threshold without sacrificing the training data for the validation data further boosts the performance. The proposed system is systematically evaluated on O2FN, AR and CAS-PEAL databases, and compared with many different approaches. Compared to the best competitive system, which is built upon Adaboost face/eye detector and ERE approach for face recognition, the proposed system reduces the overall equal error rate from 8.49% to 3.88% on the O2FN database, from 7.64% to 1.90% on the AR database and from 9.30% to 5.60% on the CAS-PEAL database. The proposed system is implemented on O2 XDA Flame and on average it takes 1.03 s for the whole process, including face detection, eye detection and face verification.
URI: https://hdl.handle.net/10356/105596
http://hdl.handle.net/10220/16604
ISSN: 0031-3203
DOI: 10.1016/j.patcog.2012.06.013
Schools: School of Electrical and Electronic Engineering 
Fulltext Permission: none
Fulltext Availability: No Fulltext
Appears in Collections:EEE Journal Articles

SCOPUSTM   
Citations 10

39
Updated on Mar 2, 2025

Web of ScienceTM
Citations 10

33
Updated on Oct 28, 2023

Page view(s) 20

772
Updated on Mar 15, 2025

Google ScholarTM

Check

Altmetric


Plumx

Items in DR-NTU are protected by copyright, with all rights reserved, unless otherwise indicated.