Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/106101
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dc.contributor.authorQi, Yajunen
dc.contributor.authorHuang, Chuanweien
dc.contributor.authorChen, Zuhuangen
dc.contributor.authorLuo, Zhenlinen
dc.contributor.authorWang, Yiqianen
dc.contributor.authorGuo, Junen
dc.contributor.authorWang, Junlingen
dc.contributor.authorGao, Chenen
dc.contributor.authorSritharan, Thirumanyen
dc.contributor.authorChen, Langen
dc.contributor.authorWhite, Timothy Johnen
dc.date.accessioned2014-09-19T04:19:25Zen
dc.date.accessioned2019-12-06T22:04:35Z-
dc.date.available2014-09-19T04:19:25Zen
dc.date.available2019-12-06T22:04:35Z-
dc.date.copyright2011en
dc.date.issued2011en
dc.identifier.citationQi, Y., Huang, C., Chen, Z., Luo, Z., Wang, Y., Guo, J., et al. (2011). Nanoscale phase separation in quasi-uniaxial and biaxial strained multiferroic thin films. Applied physics letters, 99(13), 132905-.en
dc.identifier.issn0003-6951en
dc.identifier.urihttps://hdl.handle.net/10356/106101-
dc.identifier.urihttp://hdl.handle.net/10220/20914en
dc.description.abstractNanoscale phase separation was investigated in epitaxial strained BiFeO3thin films on LaAlO3 single crystal substrate. In biaxial strained thin films, nanoscale mixtures of the tetragonal-like and rhombohedral-like phases occur with a film thickness above 35 nm. For 10-30 nm ultrathin ones, tetragonal-like single phase is confirmed using synchrotron x-ray and the atomic force microscopy studies. However, nanoscale phase separations are still observed in quasi-uniaxial transmission electron microscopy foil specimens for those ultrathin films, indicating the phase separation emerges in a much smaller thickness in uniaxial constraint films than that in biaxial ones.en
dc.language.isoenen
dc.relation.ispartofseriesApplied physics lettersen
dc.rights© 2011 American Institute of Physics. This paper was published in Applied Physics Letters and is made available as an electronic reprint (preprint) with permission of American Institute of Physics. The paper can be found at the following official DOI: [http://dx.doi.org/10.1063/1.3644958].  One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.en
dc.subjectDRNTU::Engineering::Materialsen
dc.titleNanoscale phase separation in quasi-uniaxial and biaxial strained multiferroic thin filmsen
dc.typeJournal Articleen
dc.contributor.schoolSchool of Materials Science and Engineeringen
dc.contributor.researchEnergy Research Institute @NTUen
dc.identifier.doi10.1063/1.3644958en
dc.description.versionPublished versionen
item.grantfulltextopen-
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