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Title: Nanoscale phase separation in quasi-uniaxial and biaxial strained multiferroic thin films
Authors: Qi, Yajun
Huang, Chuanwei
Chen, Zuhuang
Luo, Zhenlin
Wang, Yiqian
Guo, Jun
Wang, Junling
Gao, Chen
Sritharan, Thirumany
Chen, Lang
White, Timothy John
Keywords: DRNTU::Engineering::Materials
Issue Date: 2011
Source: Qi, Y., Huang, C., Chen, Z., Luo, Z., Wang, Y., Guo, J., et al. (2011). Nanoscale phase separation in quasi-uniaxial and biaxial strained multiferroic thin films. Applied physics letters, 99(13), 132905-.
Series/Report no.: Applied physics letters
Abstract: Nanoscale phase separation was investigated in epitaxial strained BiFeO3thin films on LaAlO3 single crystal substrate. In biaxial strained thin films, nanoscale mixtures of the tetragonal-like and rhombohedral-like phases occur with a film thickness above 35 nm. For 10-30 nm ultrathin ones, tetragonal-like single phase is confirmed using synchrotron x-ray and the atomic force microscopy studies. However, nanoscale phase separations are still observed in quasi-uniaxial transmission electron microscopy foil specimens for those ultrathin films, indicating the phase separation emerges in a much smaller thickness in uniaxial constraint films than that in biaxial ones.
ISSN: 0003-6951
DOI: 10.1063/1.3644958
Rights: © 2011 American Institute of Physics. This paper was published in Applied Physics Letters and is made available as an electronic reprint (preprint) with permission of American Institute of Physics. The paper can be found at the following official DOI: [].  One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.
Fulltext Permission: open
Fulltext Availability: With Fulltext
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