Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/106111
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dc.contributor.authorChang, Kok-Leongen
dc.contributor.authorLin, Tongen
dc.contributor.authorHo, Weng-Gengen
dc.contributor.authorChong, Kwen-Siongen
dc.contributor.authorGwee, Bah Hweeen
dc.contributor.authorChang, Joseph Sylvesteren
dc.date.accessioned2013-11-29T06:40:59Zen
dc.date.accessioned2019-12-06T22:04:47Z-
dc.date.available2013-11-29T06:40:59Zen
dc.date.available2019-12-06T22:04:47Z-
dc.date.copyright2012en
dc.date.issued2012en
dc.identifier.citationChang, K.-L., Lin, T., Ho, W.-G., Chong, K.-S., Gwee, B. H., & Chang, J. S. (2012). A comparative study on asynchronous Quasi-Delay-Insensitive templates. 2012 IEEE International Symposium on Circuits and Systems, 1819-1822.en
dc.identifier.urihttps://hdl.handle.net/10356/106111-
dc.description.abstractThe robustness of asynchronous logic has proved useful in dealing with contemporary problems in CMOS design such as process variations and power management. However, the general cryptic nature of asynchronous logic has stymied the widespread acceptance of this alternate design technique. Fortunately, the semi-custom approach to asynchronous design reduces the tedious handcrafting efforts that are often non-trivial in large system-on-chips (SoCs). However, even with the adoption of this design approach requires careful selection of asynchronous templates that will suit overall system needs. Therefore in this paper, the most eminent Quasi-Delay-Insensitive asynchronous template families reported to date will be presented, and followed by an in-depth comparison of various design FOMs - template area, static/dynamic capacity, cycle time, latency, throughput and Et2. The most aggressive template (EESTFB) can reach a maximum throughput of 3.56Giga items/s on 0.13µm @ 1.2V.en
dc.language.isoenen
dc.titleA comparative study on asynchronous Quasi-Delay-Insensitive templatesen
dc.typeConference Paperen
dc.contributor.schoolSchool of Electrical and Electronic Engineeringen
dc.contributor.conferenceIEEE International Symposium on Circuits and Systems (2012 : Seoul, Korea)en
dc.contributor.researchTemasek Laboratoriesen
dc.identifier.doi10.1109/ISCAS.2012.6271621en
item.fulltextNo Fulltext-
item.grantfulltextnone-
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