Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/106355
Title: Research on optical measurement for additive manufacturing surfaces
Authors: Cheng, Fang
Fu, Shao Wei
Leong, Yong Shin
Keywords: Engineering::Mechanical engineering
Additive Manufacturing
Surface Topography
Issue Date: 2017
Source: Cheng, F., Fu, S. W., & Leong, Y. S. (2017). Research on optical measurement for additive manufacturing surfaces. Proceedings of SPIE - International Conference on Optical and Photonics Engineering, 10250, 102501F. doi:10.1117/12.2266653
Series/Report no.: Proceedings of SPIE - International Conference on Optical and Photonics Engineering
Abstract: Surfaces made by Additive Manufacturing (AM) processes normally show higher roughness and more complicated microstructures than conventional machined surfaces. In this study, AM surface roughness measurements using both tactile and optical techniques are analyzed, theoretically and experimentally. Analytical results showed both techniques have comparable performance when measuring AM samples with good surface integrity. For surfaces with steep features, coherence scanning interferometry showed more reliable performance especially when peak-to-valley value was required. In addition of the benchmarking study, development of a low-cost measurement system, using laser confocal technology, is also presented in this paper. By comparing the measurement results with those from a coherent scanning interferometer, accuracy levels of the proposed system can be evaluated. It was concluded that with comparable accuracy, the proposed low-cost optical system was able to achieve much faster measurements, which would make it possible for in-situ surface quality checking.
URI: https://hdl.handle.net/10356/106355
http://hdl.handle.net/10220/49581
ISSN: 0277-786X
DOI: 10.1117/12.2266653
Rights: © 2017 SPIE. All rights reserved. This paper was published in Proceedings of SPIE - International Conference on Optical and Photonics Engineering and is made available with permission of SPIE.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:MAE Journal Articles

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