Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/106379
Title: Phase retrieval for high-speed 3D measurement using binary patterns with projector defocusing
Authors: Zheng, Dongliang
Kemao, Qian
Da, Feipeng
Seah, Hock Soon
Keywords: Engineering::Computer science and engineering
3D Measurement
Projector Defocusing
Issue Date: 2017
Source: Zheng, D., Kemao, Q., Da, F., & Seah, H. S. (2017). Phase retrieval for high-speed 3D measurement using binary patterns with projector defocusing. Proceedings of SPIE - Optical Measurement Systems for Industrial Inspection X, 10329, 103290V-. doi:10.1117/12.2270064
Series/Report no.: Proceedings of SPIE - Optical Measurement Systems for Industrial Inspection X
Abstract: Recent digital technology allows binary patterns to be projected with a very high speed, which shows great potential for high-speed 3D measurement. However, how to retrieve an accurate phase with an even faster speed is still challenging. In this paper, an accurate and efficient phase retrieval technique is presented, which combines a Hilbert three-step phaseshifting algorithm with a ternary Gray code-based phase unwrapping method. The Hilbert three-step algorithm uses three squared binary patterns, which can calculate an accurate phase even under a slight defocusing level. The ternary Gray code-based method uses four binary patterns, which can unwrap a phase with a large number of fringe periods. Both simulations and experiments have validated its accuracy and efficiency.
URI: https://hdl.handle.net/10356/106379
http://hdl.handle.net/10220/49601
ISSN: 0277-786X
DOI: 10.1117/12.2270064
Rights: © 2017 SPIE. All rights reserved. This paper was published in Proceedings of SPIE - Optical Measurement Systems for Industrial Inspection X and is made available with permission of SPIE.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:SCSE Journal Articles

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