Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/106408
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dc.contributor.authorPerinchery, Sandeep Menonen
dc.contributor.authorHaridas, Aswinen
dc.contributor.authorShinde, Ananten
dc.contributor.authorBuchnev, Oleksandren
dc.contributor.authorMurukeshan, Vadakke Mathamen
dc.date.accessioned2019-08-14T05:47:17Zen
dc.date.accessioned2019-12-06T22:11:01Z-
dc.date.available2019-08-14T05:47:17Zen
dc.date.available2019-12-06T22:11:01Z-
dc.date.issued2019en
dc.identifier.citationPerinchery, S. M., Haridas, A., Shinde, A., Buchnev, O., & Murukeshan, V. M. (2019). Breaking diffraction limit of far-field imaging via structured illumination bessel beam microscope (SIBM). Optics Express, 27(5), 6068-6082. doi:10.1364/OE.27.006068en
dc.identifier.issn1094-4087en
dc.identifier.urihttps://hdl.handle.net/10356/106408-
dc.description.abstractBreaking the diffraction limit in imaging microscopes with far-field imaging options has always been the thrust challenge for optical engineers and biologists over the years. Although structured illumination microscopy and Bessel beam assisted imaging has shown the capability of imaging with sub-diffraction resolutions, they rely on the use of objective lenses with large numerical apertures (NA). Hence, they fail to sustain resolutions at larger working distances. In this context, we demonstrate a method for nanoscale resolution imaging at longer working distances, named as Structured Illumination Bessel Microscopy (SIBM). The proposed method is envisaged for both biological and engineering applications that necessitate high imaging resolutions at large working distances.en
dc.description.sponsorshipEDB (Economic Devt. Board, S’pore)en
dc.description.sponsorshipMOE (Min. of Education, S’pore)en
dc.format.extent15 p.en
dc.language.isoenen
dc.relation.ispartofseriesOptics Expressen
dc.rights© 2019 Optical Society of America under the terms of the OSA Open Access Publishing Agreement. Users may use, reuse, and build upon the article, or use the article for text or data mining, so long as such uses are for non-commercial purposes and appropriate attribution is maintained. All other rights are reserved.en
dc.subjectMicroscopyen
dc.subjectEngineering::Mechanical engineeringen
dc.subjectImaging Systemsen
dc.titleBreaking diffraction limit of far-field imaging via structured illumination bessel beam microscope (SIBM)en
dc.typeJournal Articleen
dc.contributor.schoolSchool of Mechanical and Aerospace Engineeringen
dc.contributor.organizationCentre for Optical and Laser Engineeringen
dc.identifier.doi10.1364/OE.27.006068en
dc.description.versionPublished versionen
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item.grantfulltextopen-
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