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Title: Breaking diffraction limit of far-field imaging via structured illumination bessel beam microscope (SIBM)
Authors: Perinchery, Sandeep Menon
Haridas, Aswin
Shinde, Anant
Buchnev, Oleksandr
Murukeshan, Vadakke Matham
Keywords: Microscopy
Engineering::Mechanical engineering
Imaging Systems
Issue Date: 2019
Source: Perinchery, S. M., Haridas, A., Shinde, A., Buchnev, O., & Murukeshan, V. M. (2019). Breaking diffraction limit of far-field imaging via structured illumination bessel beam microscope (SIBM). Optics Express, 27(5), 6068-6082. doi:10.1364/OE.27.006068
Series/Report no.: Optics Express
Abstract: Breaking the diffraction limit in imaging microscopes with far-field imaging options has always been the thrust challenge for optical engineers and biologists over the years. Although structured illumination microscopy and Bessel beam assisted imaging has shown the capability of imaging with sub-diffraction resolutions, they rely on the use of objective lenses with large numerical apertures (NA). Hence, they fail to sustain resolutions at larger working distances. In this context, we demonstrate a method for nanoscale resolution imaging at longer working distances, named as Structured Illumination Bessel Microscopy (SIBM). The proposed method is envisaged for both biological and engineering applications that necessitate high imaging resolutions at large working distances.
ISSN: 1094-4087
DOI: 10.1364/OE.27.006068
Rights: © 2019 Optical Society of America under the terms of the OSA Open Access Publishing Agreement. Users may use, reuse, and build upon the article, or use the article for text or data mining, so long as such uses are for non-commercial purposes and appropriate attribution is maintained. All other rights are reserved.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:MAE Journal Articles

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