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Title: Microscopy using randomized speckle illumination
Authors: Perinchery, Sandeep Menon
Shinde, Anant
Murukeshan, Vadakke Matham
Keywords: Structure Illumination
Engineering::Mechanical engineering
Issue Date: 2017
Source: Perinchery, S. M., Shinde, A., & Vadakke Matham, M. (2017). Microscopy using randomized speckle illumination. Proceedings of SPIE - Fifth International Conference on Optical and Photonics Engineering, 10449, 104490H-. doi:10.1117/12.2269564
Series/Report no.: Proceedings of SPIE - International Conference on Optical and Photonics Engineering
Abstract: It is well known for structured illumination microscopy (SIM) that the lateral resolution by a factor of two beyond the classical diffraction limit is achieved using spatially structured illumination in wide-field fluorescence microscope. In the state of art SIM systems, grating patterns are generally generated by physical gratings or by spatial light modulators such as digital micro mirrors (DMD), liquid crystal displays (LCD). In this study, using a combination of LCD and ground glasses, size controlled randomized speckle patterns are generated as an illumination source for the microscope. Proof of concept of using speckle illumination in SIM configuration is tested by imaging fixed BPAE cells.
ISSN: 0277-786X
DOI: 10.1117/12.2269564
Rights: © 2017 SPIE. All rights reserved. This paper was published in Proceedings of SPIE - Fifth International Conference on Optical and Photonics Engineering and is made available with permission of SPIE.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:MAE Journal Articles

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