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Title: A time-delay-integration CMOS image sensor with pipelined charge transfer architecture
Authors: Yu, Hang
Qian, Xinyuan
Chen, Shoushun
Low, Kay-Soon
Keywords: DRNTU::Engineering::Mechanical engineering::Machine design and construction
Issue Date: 2012
Source: Yu, H., Qian, X., Chen, S., & Low, K. S. (2012). A Time-Delay-Integration CMOS image sensor with pipelined charge transfer architecture. 2012 IEEE International Symposium on Circuits and Systems, pp.1624-1627.
Abstract: In this paper, we report a novel Time-Delay-Integration (TDI) CMOS image sensor for low-earth orbit (LEO) nano-satellite imaging application, where limited exposure time and unexpected flight fluctuations are major design challenges. The sensor features programmable integration time per stage, dynamic charge transfer path and tunable well capacity. A prototype chip of 1536×8 pixels was implemented using TSMC 0.18µm CMOS image sensor process. Photodiode and other transistors are floor-planned in different arrays, providing small pixel pitch of 3.25µm and high fill factor of 57%.
DOI: 10.1109/ISCAS.2012.6271566
Fulltext Permission: none
Fulltext Availability: No Fulltext
Appears in Collections:EEE Conference Papers

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