Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/106685
Title: Effect of annealing temperature on microstructure and UV light photocatalytic activity of TiO2 films grown by atmospheric pressure CVD
Authors: Soutar, Andrew McIntosh
Ding, Xingzhao
Chua, Chin Sheng
Fang, Xiaoqin
Chen, Xiaofeng
Tan, Ooi Kiang
Tse, Man Siu
Keywords: DRNTU::Science::Chemistry
DRNTU::Science::Chemistry::Crystallography::Chemical crystallography
Issue Date: 2014
Source: Chua, C. S., Fang, X., Chen, X., Tan, O. K., Tse, M. S., Soutar, A. M., et al. (2014). Effect of annealing temperature on microstructure and UV light photocatalytic activity of TiO2 films grown by atmospheric pressure CVD. Chemical vapor deposition, 20(1-2-3), 44-50.
Series/Report no.: Chemical vapor deposition
Abstract: Titanium dioxide (TiO2) films are deposited on quartz substrates by atmospheric pressure (AP)CVD, and then annealed under simulated air (80% nitrogen, 20% oxygen) at temperatures from 600 to 900 °C to investigate the change in microstructure and the effect on the photocatalytic activity on the simulated pollutant stearic acid. The as-deposited TiO2 film is mainly composed of pure anatase phase while the rutile phase is detected only after annealing the film at 900 °C for 1 h. The photocatalytic activity of the annealed films on stearic acid under UV irradiation is found to deteriorate after the films are annealed at temperatures above 700 °C. This decrease in photocatalytic performance is observed to be the result of two possible mechanisms induced by the annealing temperature. The first mechanism is the increase in defect concentration (O− and Ti vacancies) in the annealed TiO2 films for annealing temperatures below 800 °C, and the second mechanism is the formation of large rutile grains at a higher temperature, 900 °C.
URI: https://hdl.handle.net/10356/106685
http://hdl.handle.net/10220/25098
ISSN: 0948-1907
DOI: 10.1002/cvde.201207015
Rights: © 2014 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
Fulltext Permission: none
Fulltext Availability: No Fulltext
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