Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/106789
Title: Intensity and contrast based surface roughness measurement approaches for rough and shiny surfaces
Authors: Prabhathan, P.
Song, Chaolong
Haridas, Aswin
Prasad, Guru
Chan, Kelvin
Keywords: Spectral Speckle Correlation
Surface Roughness
Engineering::Mechanical engineering
Issue Date: 2017
Source: Prabhathan, P., Song, C., Haridas, A., Prasad, G., & Chan, K. (2017). Intensity and contrast based surface roughness measurement approaches for rough and shiny surfaces. Proceedings of SPIE - Fifth International Conference on Optical and Photonics Engineering, 10449, 1049912-. doi:10.1117/12.2270535
Series/Report no.: Proceedings of SPIE - Fifth International Conference on Optical and Photonics Engineering
Abstract: In manufacturing engineering the surface finish of a machined component is of fundamental importance in order to ensure its performance. A non-contact and non-destructive device based on optical technique, is a promising alternative to stylus based device for carrying out measurement of surface quality. In addition to this, in situ monitoring of surface roughness on a workpiece is an important requirement in modern machining process, since it would increase on-line machining rate and consequently productivity. Here, measurement approaches and system configuration for surface roughness measurement using laser speckle intensity and contrast are discussed. The technique would allow full-field measurement over sample of interest having both rough and shiny surface properties. Measurement data on standard calibration plates is presented with details on the measurement accuracy and reliability.
URI: https://hdl.handle.net/10356/106789
http://hdl.handle.net/10220/49656
ISSN: 0277-786X
DOI: 10.1117/12.2270535
Rights: © 2017 SPIE. All rights reserved. This paper was published in Proceedings of SPIE - Fifth International Conference on Optical and Photonics Engineering and is made available with permission of SPIE.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:MAE Journal Articles

Google ScholarTM

Check

Altmetric


Plumx

Items in DR-NTU are protected by copyright, with all rights reserved, unless otherwise indicated.