Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/106840
Title: Fractal speckle image analysis for surface characterization of aerospace structures
Authors: Haridas, Aswin
Crivoi, Alexandru
Prabhathan, P.
Chan, Kelvin
Murukeshan, Vadakke Matham
Keywords: Engineering::Mechanical engineering
Fractal Dimension
Image Processing
Issue Date: 2017
Source: Haridas, A., Crivoi, A., Prabhathan, P., Chan, K.,& Murukeshan, V. M. (2017). Fractal speckle image analysis for surface characterization of aerospace structures. Proceedings of SPIE - Fifth International Conference on Optical and Photonics Engineering, 10449, 104491T-. doi:10.1117/12.2270769
Series/Report no.: Proceedings of SPIE - Fifth International Conference on Optical and Photonics Engineering
Abstract: Surface characterization of the working components has always been a subject of interest among researchers and industry specialists. Especially in the aerospace industry where the aerodynamic capabilities are largely altered by the surface quality of the component of interest, there remains an extensive need for developing systems for effectively characterizing the surface quality. To realize an optical based non-contact and an in-line surface roughness measurement system, it is essential to understand the relationship between the quality of the surface and statistical parameter of the reflected speckles. The range of the measurement system being proportional to the wavelength of light used makes the analysis fundamentally important in order to understand the properties of speckles at a different wavelength. In this context, this paper examines the nature of the formed IR speckles from three different diffusers by analyzing their raw structure. Image processing algorithms that are developed study the different parameters of the 8-bit binary speckles, namely, the fractal property and number of connecting components. The paper also discusses the future work direction on relating the proposed analysis to derive the algorithm required for evaluating the surface finish parameters.
URI: https://hdl.handle.net/10356/106840
http://hdl.handle.net/10220/49667
ISSN: 0277-786X
DOI: 10.1117/12.2270769
Rights: © 2017 SPIE. All rights reserved. This paper was published in Proceedings of SPIE - Fifth International Conference on Optical and Photonics Engineering and is made available with permission of SPIE.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:MAE Journal Articles

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