Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/106847
Title: Instrument transfer function for digital holography system
Authors: Asundi, Anand Krishna
Yu, Yingjie
Sun, Tao
Keywords: Instrument Transfer Function
Digital Holography
Engineering::Mechanical engineering
Issue Date: 2017
Source: Sun, T., Asundi, A. K., & Yu, Y. (2017). Instrument transfer function for digital holography system. Proceedings of SPIE - Fifth International Conference on Optical and Photonics Engineering, 10449, 104491D-. doi:10.1117/12.2270644
Series/Report no.: Proceedings of SPIE - Fifth International Conference on Optical and Photonics Engineering
Abstract: Digital holography system can quantitatively obtain the microscopic appearance of the measured surface, with non-contact, high precision, large measuring range, etc. Among the varies of characterizing a system, Instrument Transfer Function (ITF) is the most appealing method, which can describe the system response in terms of an input signal’s frequency content. In this paper, we proposed a method to calculate the system transfer function of digital holography system for measure a high quality phase step, which contains all spatial frequencies. The ITF can be calculated across all frequencies with a single measurement by comparing the Power spectral Density (PSD) of a measured step to the theoretical PSD. The method is applied to calculate the ITF of digital holography system. Experimental result shows that the ITF of the digital holography system is above 60%.The result shows that the ITF of digital holography system could be kept at acceptable levels within the range of interest.
URI: https://hdl.handle.net/10356/106847
http://hdl.handle.net/10220/49659
ISSN: 0277-786X
DOI: 10.1117/12.2270644
Rights: © 2017 SPIE. All rights reserved. This paper was published in Proceedings of SPIE - Fifth International Conference on Optical and Photonics Engineering and is made available with permission of SPIE.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:MAE Journal Articles

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