Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/106912
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dc.contributor.authorQian, Kemaoen
dc.contributor.editorCreath, Katherineen
dc.contributor.editorBurke, Janen
dc.contributor.editorSchmit, Joannaen
dc.date.accessioned2015-03-09T06:18:29Zen
dc.date.accessioned2019-12-06T22:20:51Z-
dc.date.available2015-03-09T06:18:29Zen
dc.date.available2019-12-06T22:20:51Z-
dc.date.copyright2014en
dc.date.issued2014en
dc.identifier.citationQian, K. (2014). Links between fringe pattern analysis and digital image correlation : windowed, optimal, and tracking (WOT). Proceedings of SPIE- Interferometry XVII: Techniques and Analysis, 9203, 92030M-.en
dc.identifier.urihttps://hdl.handle.net/10356/106912-
dc.description.abstractA windowed, optimal and tracking (WOT) strategy for measurement data analysis is described, explained and discussed. Many fringe pattern analysis and digital image correlation algorithms adopted this strategy, and thus their similarities and links are revealed. Although this strategy is not new, highlighting it is believed to be helpful for future algorithm development.en
dc.format.extent6 p.en
dc.language.isoenen
dc.rights© 2014 Society of Photo-Optical Instrumentation Engineers (SPIE). This paper was published in Proceedings of SPIE- Interferometry XVII: Techniques and Analysis and is made available as an electronic reprint (preprint) with permission of Society of Photo-Optical Instrumentation Engineers (SPIE). The paper can be found at the following official DOI: [http://dx.doi.org/10.1117/12.2059757].  One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.en
dc.subjectDRNTU::Engineering::Computer science and engineering::Software::Programming techniquesen
dc.titleLinks between fringe pattern analysis and digital image correlation : windowed, optimal, and tracking (WOT)en
dc.typeConference Paperen
dc.contributor.schoolSchool of Computer Engineeringen
dc.contributor.conferenceInterferometry XVII: Techniques and Analysisen
dc.identifier.doi10.1117/12.2059757en
dc.description.versionPublished versionen
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