Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/107114
Title: Depth extension and sidelobe suppression in optical coherence tomography using pupil filters
Authors: Gu, Jun
Cui, Dongyao
Wu, Junying
Yu, Xiaojun
Liu, Xinyu
Liu, Linbo
Keywords: DRNTU::Engineering::Electrical and electronic engineering::Optics, optoelectronics, photonics
Issue Date: 2014
Source: Yu, X., Liu, X., Gu, J., Cui, D., Wu, J., Liu, L. (2014). Depth extension and sidelobe suppression in optical coherence tomography using pupil filters. Optics express, 22(22), 26956-26966.
Series/Report no.: Optics express
Abstract: We demonstrate a new focus engineering scheme to achieve both extended depth of focus (DOF) and sidelobe suppression in spectral-domain optical coherence tomography (SD-OCT) system. Each of the illumination pupil function and the detection pupil function is modulated using an annular pupil filter implemented by center obscuration. The two pupil filters are arranged in a dark-field configuration such that the first sidelobe of the illumination point-spread function (PSF) matches the first minimum of the detection PSF in the lateral focal plane. We tested the feasibility of the proposed scheme numerically, and then constructed a dark-field OCT (DF-OCT) system to further verify its effectiveness experimentally. Simulation results show that a DOF gain of 4.2 can be achieved compared with a full aperture OCT (FA-OCT) system, with a suppression ratio of 2.9 dB for the first sidelobe compared with an annular-aperture bright-field OCT (BF-OCT) system. Experimental results show that the constructed DF-OCT extends the DOF by three-fold compared with the constructed FA-OCT, and suppresses the first sidelobe by 3.1 dB compared with the BF-OCT. The penalty for the extended DOF is an ~11.6 dB drop in sensitivity compared with the FA-OCT system.
URI: https://hdl.handle.net/10356/107114
http://hdl.handle.net/10220/25251
ISSN: 1094-4087
DOI: 10.1364/OE.22.026956
Rights: © 2014 Optical Society of America. This is the author created version of a work that has been peer reviewed and accepted for publication by Optics Express, Optical Society of America. It incorporates referee’s comments but changes resulting from the publishing process, such as copyediting, structural formatting, may not be reflected in this document. The published version is available at: [http://dx.doi.org/10.1364/OE.22.026956].
Fulltext Permission: open
Fulltext Availability: With Fulltext
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