Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/107189
Title: A fast edge detection algorithm using binary labels
Authors: Shi, Yuying
Gu, Ying
Wang, Li-Lian
Tai, Xue-Cheng
Keywords: DRNTU::Science::Mathematics::Discrete mathematics::Algorithms
Issue Date: 2015
Source: Shi, Y., Gu, Y., Wang, L.-L., & Tai, X.-C. (2015). A fast edge detection algorithm using binary labels. Inverse problems and imaging, 9(2), 551-578.
Series/Report no.: Inverse problems and imaging
Abstract: Edge detection (for both open and closed edges) from real images is a challenging problem. Developing fast algorithms with good accuracy and stability for noisy images is difficult yet and in demand. In this work, we present a variational model which is related to the well-known Mumford-Shah functional and design fast numerical methods to solve this new model through a binary labeling processing. A pre-smoothing step is implemented for the model, which enhances the accuracy of detection. Ample numerical experiments on grey-scale as well as color images are provided. The efficiency and accuracy of the model and the proposed minimization algorithms are demonstrated through comparing it with some existing methodologies.
URI: https://hdl.handle.net/10356/107189
http://hdl.handle.net/10220/25395
ISSN: 1930-8337
DOI: 10.3934/ipi.2015.9.551
Rights: © 2015 American Institute of Mathematical Sciences. This paper was published in Inverse Problems and Imaging and is made available as an electronic reprint (preprint) with permission of American Institute of Mathematical Sciences. The paper can be found at the following official DOI: [http://dx.doi.org/10.3934/ipi.2015.9.551].  One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:SPMS Journal Articles

Files in This Item:
File Description SizeFormat 
A FAST EDGE DETECTION ALGORITHM USING BINARY LABELS.pdf3.39 MBAdobe PDFThumbnail
View/Open

SCOPUSTM   
Citations 20

8
Updated on Jan 20, 2023

Web of ScienceTM
Citations 20

6
Updated on Jan 25, 2023

Page view(s) 50

477
Updated on Jan 29, 2023

Download(s) 10

309
Updated on Jan 29, 2023

Google ScholarTM

Check

Altmetric


Plumx

Items in DR-NTU are protected by copyright, with all rights reserved, unless otherwise indicated.