Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/107372
Title: High-order localized spoof surface plasmon resonances and experimental verifications
Authors: Liao, Zhen
Luo, Yu
Fernández-Domínguez, Antonio I.
Shen, Xiaopeng
Maier, Stefan A.
Cui, Tie Jun
Keywords: DRNTU::Engineering::Electrical and electronic engineering::Antennas, wave guides, microwaves, radar, radio
Issue Date: 2015
Source: Liao, Z., Luo, Y., Fernández-Domínguez, A. I., Shen, X., Maier, S. A., & Cui, T. J. (2015). High-order localized spoof surface plasmon resonances and experimental verifications. Scientific reports, 59590-.
Series/Report no.: Scientific reports
Abstract: We theoretically demonstrated and experimentally verified high-order radial spoof localized surface plasmon resonances supported by textured metal particles. Through an effective medium theory and exact numerical simulations, we show the emergence of these geometrically-originated electromagnetic modes at microwave frequencies. The occurrence of high-order radial spoof plasmon resonances is experimentally verified in ultrathin disks. Their spectral and near-field properties are characterized experimentally, showing an excellent agreement with theoretical predictions. Our findings shed light into the nature of spoof localized surface plasmons, and open the way to the design of broadband plasmonic devices able to operate at very different frequency regimes.
URI: https://hdl.handle.net/10356/107372
http://hdl.handle.net/10220/25613
ISSN: 2045-2322
DOI: 10.1038/srep09590
Schools: School of Electrical and Electronic Engineering 
Rights: This work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the article's Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commons license, users will need to obtain permission from the license holder in order to reproduce the material. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles

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