Please use this identifier to cite or link to this item:
Title: Transverse domain wall profile for spin logic applications
Authors: Ramu, Maddu
Murapaka, Chandrasekhar
Goolaup, Sarjoosing
Keywords: DRNTU::Science::Mathematics::Mathematical logic
Issue Date: 2015
Source: Goolaup, S., Ramu, M., Murapaka, C., & Lew, W. S. (2015). Transverse domain wall profile for spin logic applications. Scientific reports, 5, 9603-.
Series/Report no.: Scientific reports
Abstract: Domain wall (DW) based logic and memory devices require precise control and manipulation of DW in nanowire conduits. The topological defects of Transverse DWs (TDW) are of paramount importance as regards to the deterministic pinning and movement of DW within complex networks of conduits. In-situ control of the DW topological defects in nanowire conduits may pave the way for novel DW logic applications. In this work, we present a geometrical modulation along a nanowire conduit, which allows for the topological rectification/inversion of TDW in nanowires. This is achieved by exploiting the controlled relaxation of the TDW within an angled rectangle. Direct evidence of the logical operation is obtained via magnetic force microscopy measurement.
ISSN: 2045-2322
DOI: 10.1038/srep09603
Rights: This work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commons license, users will need to obtain permission from the license holder in order to reproduce the material. To view a copy of this license, visit
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:SPMS Journal Articles

Files in This Item:
File Description SizeFormat 
Transverse Domain Wall Profile for Spin.pdf5.15 MBAdobe PDFThumbnail

Google ScholarTM



Items in DR-NTU are protected by copyright, with all rights reserved, unless otherwise indicated.