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https://hdl.handle.net/10356/107502
Title: | Experimental investigations and parametric studies of surface roughness measurements using spectrally correlated speckle images | Authors: | Prabhathan, Patinharekandy Song, Chaolong Haridas, Aswin Prasad, Guru Chan, Kelvin H. K. Murukeshan, Vadakke Mataham |
Keywords: | Surface Roughness Engineering::Mechanical engineering Spectral Speckle Correlation |
Issue Date: | 2017 | Source: | Prabhathan, P., Song, C., Haridas, A., Prasad, G., Chan, K., & Murukeshan, V. M. (2017). Experimental investigations and parametric studies of surface roughness measurements using spectrally correlated speckle images. Proceedings of SPIE - Fifth International Conference on Optical and Photonics Engineering, 10449, 1044913-. doi:10.1117/12.2270539 | Series/Report no.: | Proceedings of SPIE - Fifth International Conference on Optical and Photonics Engineering | Abstract: | The surface roughness parameters encoded in a speckle pattern can be effectively extracted through correlation experiments. In the case of spectrally correlated speckle images, the degree of decorrelation arises from wavelength difference in the laser light irradiated on the surface. To obtain accurate results in such methodology, a proper design of experiments is important due to more than one parameter involved in the experiment. Here, experimental investigations and parametric studies of surface roughness measurements using spectral speckle correlation methodology are presented, considering the potential variables in the system. The sources of error and factors affecting the accuracy in measurement are identified and the experimental results obtained from standard calibration plate samples are presented. | URI: | https://hdl.handle.net/10356/107502 http://hdl.handle.net/10220/49694 |
ISSN: | 0277-786X | DOI: | 10.1117/12.2270539 | Rights: | © 2017 SPIE. All rights reserved. This paper was published in Proceedings of SPIE - Fifth International Conference on Optical and Photonics Engineering and is made available with permission of SPIE. | Fulltext Permission: | open | Fulltext Availability: | With Fulltext |
Appears in Collections: | MAE Journal Articles |
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