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Title: A corner reflector of graphene Dirac fermions as a phonon-scattering sensor
Authors: Graef, Holger
Teo, Edwin Hang Tong
Wilmart, Q.
Rosticher, M.
Mele, D.
Banszerus, L.
Stampfer, C.
Taniguchi, T.
Watanabe, K.
Berroir, J.-M.
Bocquillon, E.
Fève, G.
Plaçais, B.
Keywords: Nanoscience and Technology
Engineering::Electrical and electronic engineering
Issue Date: 2019
Source: Graef, H., Wilmart, Q., Rosticher, M., Mele, D., Banszerus, L., Stampfer, C., . . . Plaçais, B. (2019). A corner reflector of graphene Dirac fermions as a phonon-scattering sensor. Nature Communications, 10(1), 2428-. doi:10.1038/s41467-019-10326-6
Series/Report no.: Nature Communications
Abstract: Dirac fermion optics exploits the refraction of chiral fermions across optics-inspired Klein-tunneling barriers defined by high-transparency p-n junctions. We consider the corner reflector (CR) geometry introduced in optics or radars. We fabricate Dirac fermion CRs using bottom-gate-defined barriers in hBN-encapsulated graphene. By suppressing transmission upon multiple internal reflections, CRs are sensitive to minute phonon scattering rates. Here we report on doping-independent CR transmission in quantitative agreement with a simple scattering model including thermal phonon scattering. As a signature of CRs, we observe Fabry-Pérot oscillations at low temperature, consistent with single-path reflections. Finally, we demonstrate high-frequency operation which promotes CRs as fast phonon detectors. Our work establishes the relevance of Dirac fermion optics in graphene and opens a route for its implementation in topological Dirac matter.
DOI: 10.1038/s41467-019-10326-6
Rights: © 2019 The Author(s). Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles

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