Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/107545
Title: Direct Si-Si bonding through self-assembled monolayers
Authors: Eow, Desmond Fu Shen
Keywords: Si–Si bonding
Self-Assembled monolayer
Issue Date: 2016
Source: Eow, D. F. S. (2016, March). Direct Si-Si bonding through self-assembled monolayers. Presented at Discover URECA @ NTU poster exhibition and competition, Nanyang Technological University, Singapore.
Abstract: Currently, the most widely used bonding method is hydrophilic bonding of oxidized surfaces, which provides high bonding strength. The presence of oxide interface leads to high resistivity and limits the practical applications of bonded wafers. Therefore, oxides-free bonding is desired. It can be realized by surface plasma bonding with fast ion beams in a vacuum chamber. However, this bonding method can result in formation of amorphous layer at the bonding interface. Direct wafer bonding through Self-assembled monolayers (SAM) is anticipated to be an enabling method for oxides-free bonding. Organic monolayers can form spontaneously on surface of substrate by adsorption and passivated the surface from oxidation. After high temperature desorption annealing, the two mating surfaces can bond by covalent bonds. [Peer Assessment Review]
URI: https://hdl.handle.net/10356/107545
http://hdl.handle.net/10220/41629
Schools: School of Electrical and Electronic Engineering 
Rights: © 2016 The Author(s).
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:URECA Posters

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