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Title: Path oriented boolean test generation for single stuck-at fault in combinational circuits
Authors: Zhang, Xudong
Keywords: DRNTU::Engineering::Electrical and electronic engineering::Electronic circuits
DRNTU::Engineering::Computer science and engineering::Theory of computation::Analysis of algorithms and problem complexity
Issue Date: 1999
Abstract: To produce reliable electronic systems, defect-free components must be available. Automatic test pattern generation systems distinguish defective components from defect-free components by generating input sets that cause the outputs of a component under test to be different if the component is defective than if it is defect-free. As the logic circuits under test get larger, generating tests is becoming harder. Test generation has been proved to be a NP-complete problem.
Fulltext Permission: restricted
Fulltext Availability: With Fulltext
Appears in Collections:EEE Theses

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