Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/13349
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dc.contributor.authorAjith Abraham Padathen_US
dc.date.accessioned2008-10-20T07:25:59Z
dc.date.available2008-10-20T07:25:59Z
dc.date.copyright1998en_US
dc.date.issued1998en_US
dc.identifier.urihttp://hdl.handle.net/10356/13349
dc.description.abstractReliability optimization requires models giving a direct relation between changeable design parameters and the reliability of a system . According to the conventional reliability prediction methods, optimization possibility for electronic circuits is by decreasing the temperature , load , voltage , changing application environment , part quality screening etc. which are hardly applicable and realized in practical situation .en_US
dc.format.extent144 p.en_US
dc.language.isoenen_US
dc.subjectDRNTU::Engineering::Electrical and electronic engineering::Electronic circuitsen_US
dc.titleReliability modeling and optimization of electronic circuits by stressor/susceptibility analysisen_US
dc.typeThesisen_US
dc.contributor.supervisorSaratchandran, Paramasivanen_US
dc.contributor.schoolSchool of Electrical and Electronic Engineeringen_US
dc.description.degreeMaster of Science (Computer Control and Automation)en_US
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