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Title: | Reliability modeling and optimization of electronic circuits by stressor/susceptibility analysis | Authors: | Ajith Abraham Padath | Keywords: | DRNTU::Engineering::Electrical and electronic engineering::Electronic circuits | Issue Date: | 1998 | Abstract: | Reliability optimization requires models giving a direct relation between changeable design parameters and the reliability of a system . According to the conventional reliability prediction methods, optimization possibility for electronic circuits is by decreasing the temperature , load , voltage , changing application environment , part quality screening etc. which are hardly applicable and realized in practical situation . | URI: | http://hdl.handle.net/10356/13349 | Fulltext Permission: | restricted | Fulltext Availability: | With Fulltext |
Appears in Collections: | EEE Theses |
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AJITH_ABRAHAM_PADATH_1998.pdf Restricted Access | 11.6 MB | Adobe PDF | View/Open |
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