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|Title:||Reliability modeling and optimization of electronic circuits by stressor/susceptibility analysis||Authors:||Ajith Abraham Padath||Keywords:||DRNTU::Engineering::Electrical and electronic engineering::Electronic circuits||Issue Date:||1998||Abstract:||Reliability optimization requires models giving a direct relation between changeable design parameters and the reliability of a system . According to the conventional reliability prediction methods, optimization possibility for electronic circuits is by decreasing the temperature , load , voltage , changing application environment , part quality screening etc. which are hardly applicable and realized in practical situation .||URI:||http://hdl.handle.net/10356/13349||Fulltext Permission:||restricted||Fulltext Availability:||With Fulltext|
|Appears in Collections:||EEE Theses|
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