Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/137082
Title: A low-power reliability enhanced arbiter physical unclonable function based on current starved multiplexers
Authors: Wang, Si
Cao, Yuan
Chang, Chip-Hong
Keywords: Engineering::Electrical and electronic engineering::Integrated circuits
Issue Date: 2018
Source: Wang, S., Cao, Y., & Chang, C.-H. (2018). A low-power reliability enhanced arbiter physical unclonable function based on current starved multiplexers. 2018 14th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT). doi:10.1109/ICSICT.2018.8565701
Abstract: Arbiter Physical Unclonable Function (APUF) is a popular lightweight strong PUF. The most criticized operational deficiency of APUF over other strong PUFs is its reliability against temperature and supply variations. In this paper, a novel low-power current starved (CS) multiplexer (MUX) based strong PUF is proposed. CS-MUX harnesses greater stochastic delay distribution from the manufacturing process variation than the CS inverter and regular MUX. Its output current can be controlled by a current mirror to minimize the energy consumption while desentizing the delay deviation against environmental variations. The proposed PUF design is simulated using 65nm CMOS technology. The results show that the power consumption of a 64-stage current starved MUX based PUF under nominal condition is only 2.1μW per challenge-response pair (CRP) at frequency of 20MHz which is equivalent to 0.105pJ per cycle. It has a reduction of 96.3% and 96.2% in energy per cycle compared with regular arbiter based and CS inverter based PUFs, respectively. Its worst-case reliability is 94.64% over a temperature range of -5 ∼ 100 °C, which are 14.52% and 8.32% more reliable than regular arbiter based and CS inverter based PUFs, respectively. Its worst-case reliability over a supply voltage range of 1.1 ∼ 1.3V is 95.51%, which are 6% and 4.5% better than regular arbiter based and CS inverter based PUFs, respectively.
URI: https://hdl.handle.net/10356/137082
ISBN: 9781538644409
DOI: 10.1109/ICSICT.2018.8565701
DOI (Related Dataset): https://doi.org/10.21979/N9/MWVFNO
Rights: © 2018 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The published version is available at: https://doi.org/10.1109/ICSICT.2018.8565701
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Conference Papers

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