Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/137214
Title: Multiple LOD-FDTD method for inhomogeneous coupled transmission lines and stability analyses
Authors: Heh, Ding Yu
Tan, Eng Leong
Keywords: Engineering::Electrical and electronic engineering
Issue Date: 2019
Source: Heh, D. Y., & Tan, E. L. (2020). Multiple LOD-FDTD method for inhomogeneous coupled transmission lines and stability analyses. IEEE Transactions on Antennas and Propagation, 68(3), 2198-2205. doi:10.1109/tap.2019.2943428
Journal: IEEE Transactions on Antennas and Propagation
Abstract: A multiple locally 1-D (MLOD) finite-difference time-domain (FDTD) method for inhomogeneous coupled transmission lines and stability analyses are presented. The method is aptly called the MLOD coupled line (CL)-FDTD method. Various split matrices are proposed, and the corresponding update equations are formulated and discussed. All the proposed split matrices yield implicit electric field update equations with tridiagonal or block tridiagonal matrices on the left-hand sides. For more efficiency, the block tridiagonal matrices for implicit electric field may be reformulated and replaced with tridiagonal matrices for implicit magnetic field. The stability analysis is first performed using the von Neumann method in the Fourier domain. It is shown that the von Neumann method alone may not be sufficient to ascertain stability for inhomogeneous media. To include media inhomogeneity, the two-media reduced-matrix stability analysis is proposed. It allows us to efficiently analyze the key stability characteristics in inhomogeneous media and is useful for quick detection of any potential instability that is not apparent via the von Neumann method. The stability characteristics with variation of media parameters are also investigated and discussed. The numerical results are provided to validate the stability and accuracy of the proposed MLOD CL-FDTD method with various split matrices.
URI: https://hdl.handle.net/10356/137214
ISSN: 0018-926X
DOI: 10.1109/TAP.2019.2943428
Schools: School of Electrical and Electronic Engineering 
Rights: © 2019 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The published version is available at: https://doi.org/10.1109/TAP.2019.2943428
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles

SCOPUSTM   
Citations 50

5
Updated on Apr 8, 2024

Web of ScienceTM
Citations 50

3
Updated on Oct 30, 2023

Page view(s)

181
Updated on Apr 15, 2024

Download(s) 50

67
Updated on Apr 15, 2024

Google ScholarTM

Check

Altmetric


Plumx

Items in DR-NTU are protected by copyright, with all rights reserved, unless otherwise indicated.