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Title: Unsupervised surface defect detection using deep autoencoders and data augmentation
Authors: Abdul Mujeeb
Dai, Wenting
Erdt, Marius
Sourin, Alexei
Keywords: Engineering::Computer science and engineering
Issue Date: 2018
Source: Abdul Mujeeb, Dai, W., Erdt, M., & Sourin, A. (2018). Unsupervised surface defect detection using deep autoencoders and data augmentation. Proceedings of the 2018 International Conference on Cyberworlds (CW), 391-398. doi:10.1109/cw.2018.00076
Project: SMA-RP4
Abstract: Surface level defect detection, such as detecting missing components, misalignments and physical damages, is an important step in any manufacturing process. In this paper, similarity matching techniques for manufacturing defect detection are discussed. We are proposing an algorithm which detects surface level defects without relying on the availability of defect samples for training. Furthermore, we are also proposing a method which works when only one or a few reference images are available. It implements a deep autoencoder network and trains input reference image(s) along with various copies automatically generated by data augmentation. The trained network is then able to generate a descriptor-a unique signature of the reference image. After training, a test image of the same product is sent to the trained network to generate a test image descriptor. By matching the reference and test descriptors, a similarity score is generated which indicates if a defect is found. Our experiments show that this approach is more generic than traditional hand-engineered feature extraction methods and it can be applied to detect multiple type of defects.
DOI: 10.1109/cw.2018.00076
Rights: © 2018 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The published version is available at:
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:SCSE Conference Papers

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