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https://hdl.handle.net/10356/138045
Title: | Interfacial mechanism for efficient resistive switching in Ruddlesden-Popper perovskites for non-volatile memories | Authors: | Solanki, Ankur Guerrero, Antonio Zhang, Qiannan Bisquert, Juan Sum, Tze Chien |
Keywords: | Science::Physics | Issue Date: | 2019 | Source: | Solanki, A., Guerrero, A., Zhang, Q., Bisquert, J., & Sum, T. C. (2020). Interfacial mechanism for efficient resistive switching in Ruddlesden-Popper perovskites for non-volatile memories. Journal of Physical Chemistry Letters, 11(2), 463-470. doi:10.1021/acs.jpclett.9b03181 | Project: | NTU Start-up Grant M4080514 JSPS-NTU Joint Research Project M4082176 MOE AcRF Tier 1 Grant RG173/16 MOE AcRF Tier 2 Grant MOE2015-T2-2-015 MOE AcRF Tier 2 Grant MOE2016-T2-1-034 MOE AcRF Tier 2 Grant MOE2017-T2-1-110 Singapore National Research Foundation NRF Investigatorship Programme NRF-NRFI-2018-04 Ministerio de Ciencia, Innovacioń y Universidades of Spain under Project MAT2016-76892-C3-1-R MICINN Ramoń y Cajal Fellowship (RYC201416809) University Jaume I (UJI-B2017-32) |
Journal: | Journal of Physical Chemistry Letters | Abstract: | Ion migration, one origin of current-voltage hysteresis, is the bane of halide perovskite optoelectronics. Herein, we leverage this unwelcome trait to unlock new opportunities for resistive switching using layered Ruddlesdsen-Popper perovskites (RPPs) and explicate the underlying mechanisms. The ON/OFF ratio of RPP-based devices is strongly dependent on the layers and peaks at n̅ = 5, demonstrating the highest ON/OFF ratio of ∼104 and minimal operation voltage in 1.0 mm2 devices. Long data retention even in 60% relative humidity and stable write/erase capabilities exemplify their potential for memory applications. Impedance spectroscopy reveals a chemical reaction between migrating ions and the external contacts to modify the charge transfer barrier at the interface to control the resistive states. Our findings explore a new family of facile materials and the necessity of ionic population, migration, and their reactivity with external contacts in devices for switching and memory applications. | URI: | https://hdl.handle.net/10356/138045 | ISSN: | 1948-7185 | DOI: | 10.1021/acs.jpclett.9b03181 | DOI (Related Dataset): | 10.21979/N9/5DXP9O | Schools: | School of Physical and Mathematical Sciences | Rights: | This document is the Accepted Manuscript version of a Published Work that appeared in final form in Journal of Physical Chemistry Letters, copyright © American Chemical Society after peer review and technical editing by the publisher. To access the final edited and published work see https://doi.org/10.1021/acs.jpclett.9b03181 | Fulltext Permission: | open | Fulltext Availability: | With Fulltext |
Appears in Collections: | SPMS Journal Articles |
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