Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/138451
Title: Terahertz sensing of 7 nm dielectric film with bound states in the continuum metasurfaces
Authors: Srivastava, Yogesh Kumar
Ako, Rajour Tanyi
Gupta, Manoj
Bhaskaran, Madhu
Sriram, Sharath
Singh, Ranjan
Keywords: Science::Physics
Issue Date: 2019
Source: Srivastava, Y. K., Ako, R. T., Gupta, M., Bhaskaran, M., Sriram, S., & Singh, R. (2019). Terahertz sensing of 7 nm dielectric film with bound states in the continuum metasurfaces. Applied Physics Letters, 115(15), 151105-. doi:10.1063/1.5110383
Project: Ministry of Education AcRF Tier 1 grant RG191/17
Ministry of Education Tier 2 Grant No. MOE2017-T2-1-110
Journal: Applied Physics Letters
Abstract: The fingerprint spectral response of several materials with terahertz electromagnetic radiation indicates that terahertz technology is an effective tool for sensing applications. However, sensing few nanometer thin-films of dielectrics with much longer terahertz waves (1 THz = 0.3 mm) is challenging. Here, we demonstrate a quasibound state in the continuum (BIC) resonance for sensing of a nanometer scale thin analyte deposited on a flexible metasurface. The large sensitivity originates from the strong local field confinement of the quasi-BIC Fano resonance state and extremely low absorption loss of a low-index cyclic olefin copolymer substrate. A minimum thickness of 7 nm thin-film of germanium is sensed on the metasurface, which corresponds to a deep subwavelength scale of λ/43 000, where λ is the resonance wavelength. The low-loss, flexible, and large mechanical strength of the quasi-BIC microstructured metamaterial sensor could be an ideal platform for developing ultrasensitive wearable terahertz sensors.
URI: https://hdl.handle.net/10356/138451
ISSN: 0003-6951
DOI: 10.1063/1.5110383
DOI (Related Dataset): https://doi.org/10.21979/N9/45EWUQ
Rights: © 2019 The Author(s). All rights reserved. This paper was published by AIP in Applied Physics Letters and is made available with permission of The Author(s).
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:SPMS Journal Articles

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