Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/138451
Title: Terahertz sensing of 7 nm dielectric film with bound states in the continuum metasurfaces
Authors: Srivastava, Yogesh Kumar
Ako, Rajour Tanyi
Gupta, Manoj
Bhaskaran, Madhu
Sriram, Sharath
Singh, Ranjan
Keywords: Science::Physics
Issue Date: 2019
Source: Srivastava, Y. K., Ako, R. T., Gupta, M., Bhaskaran, M., Sriram, S., & Singh, R. (2019). Terahertz sensing of 7 nm dielectric film with bound states in the continuum metasurfaces. Applied Physics Letters, 115(15), 151105-. doi:10.1063/1.5110383
Project: Ministry of Education AcRF Tier 1 grant RG191/17
Ministry of Education Tier 2 Grant No. MOE2017-T2-1-110
Journal: Applied Physics Letters
Abstract: The fingerprint spectral response of several materials with terahertz electromagnetic radiation indicates that terahertz technology is an effective tool for sensing applications. However, sensing few nanometer thin-films of dielectrics with much longer terahertz waves (1 THz = 0.3 mm) is challenging. Here, we demonstrate a quasibound state in the continuum (BIC) resonance for sensing of a nanometer scale thin analyte deposited on a flexible metasurface. The large sensitivity originates from the strong local field confinement of the quasi-BIC Fano resonance state and extremely low absorption loss of a low-index cyclic olefin copolymer substrate. A minimum thickness of 7 nm thin-film of germanium is sensed on the metasurface, which corresponds to a deep subwavelength scale of λ/43 000, where λ is the resonance wavelength. The low-loss, flexible, and large mechanical strength of the quasi-BIC microstructured metamaterial sensor could be an ideal platform for developing ultrasensitive wearable terahertz sensors.
URI: https://hdl.handle.net/10356/138451
ISSN: 0003-6951
DOI: 10.1063/1.5110383
DOI (Related Dataset): https://doi.org/10.21979/N9/45EWUQ
Schools: School of Physical and Mathematical Sciences 
Organisations: Centre for Disruptive Photonic Technologies
The Photonics Institute
Rights: © 2019 The Author(s). All rights reserved. This paper was published by AIP in Applied Physics Letters and is made available with permission of The Author(s).
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:SPMS Journal Articles

Files in This Item:
File Description SizeFormat 
Manuscript_Terahertz sensing of 7nm thin dielectric film with BIC.pdfJust Accepted version of the manuscript1.01 MBAdobe PDFThumbnail
View/Open
Revised Supplementary Material.pdfSupplementary material641.87 kBAdobe PDFThumbnail
View/Open

SCOPUSTM   
Citations 5

228
Updated on Apr 20, 2025

Web of ScienceTM
Citations 5

148
Updated on Oct 26, 2023

Page view(s)

280
Updated on May 5, 2025

Download(s) 5

652
Updated on May 5, 2025

Google ScholarTM

Check

Altmetric


Plumx

Items in DR-NTU are protected by copyright, with all rights reserved, unless otherwise indicated.