Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/138717
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dc.contributor.authorLee, Quan Kenen_US
dc.date.accessioned2020-05-12T03:58:10Z-
dc.date.available2020-05-12T03:58:10Z-
dc.date.issued2020-
dc.identifier.urihttps://hdl.handle.net/10356/138717-
dc.description.abstractAntimonene, an atomic monolayer of antimony (Sb), is predicted to have high mobility and stability which are suitable for next generation electronics, optoelectronics and energy devices. Antimonene is known to be stable at room temperature and is less reactive than phosphorene, which is the reason why there are much more scientific interest in the material in the recent years. In this project, antimonene nanofilms were deposited using the low power sputtering system. Parameters, such as deposition time and temperature, were explored to optimize the deposition recipes. Samples of antimonene nanofilms were subjected to characterization for the thickness and optical properties. The changes in thickness profiles of the samples were characterized via atomic force microscope, while the structural changes were characterized through Raman spectroscopy and the optical properties were characterize via Ellipsometry.en_US
dc.language.isoenen_US
dc.publisherNanyang Technological Universityen_US
dc.relationA2202-191en_US
dc.subjectEngineering::Electrical and electronic engineeringen_US
dc.titleOptical characterization of antimonene nanofilms deposited by low power sputteringen_US
dc.typeFinal Year Project (FYP)en_US
dc.contributor.supervisorTay Beng Kangen_US
dc.contributor.schoolSchool of Electrical and Electronic Engineeringen_US
dc.description.degreeBachelor of Engineering (Electrical and Electronic Engineering)en_US
dc.contributor.supervisoremailebktay@ntu.edu.sgen_US
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Appears in Collections:EEE Student Reports (FYP/IA/PA/PI)
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